Following these events, most of the energy provided in the consecutive cycles is dissipated through the thin formed filaments that in turn cause their fusing via Joule heating [13]. This event occurred during the eighth and seventh cycles for the cases A and B, respectively, when there is a sharp resistance increase; their corresponding network topologies are shown in Figure 2d,k. From then on, both cases A and B experienced similar state evolution (switching events III, IV, and

V), but unlike the first two switching events (I and II), cases A and B require the same activation energy for forming and rupturing the percolation filaments in the following switching events. Detailed resistive switching events occurred at cycles 9, CAL-101 mw 10, and Crenigacestat in vivo 11 with corresponding filament distribution illustrated in Figure 2e,f,g and Figure 2m,n,o for cases A and B, respectively. Finally, both cases A and B remain at similar LRS which is consistent with the measured results, since the conductive TiO2-x is dominant in active cores after a number of programming cycles and the selleck products devices are approaching their endurance limits. It is worthy to point out that for specific switching events, the set or reset transition could be closely related to its previous state [8, 9]. Nonetheless,

as illustrated in Figure 2, the corresponding defect distributions in cycle 15 (Figure 2h,p) are Etomidate very

dissimilar for the two studied cases (A and B), yet they exhibit identical LRS. Clearly, if a reverse biasing polarity was used to reset the device in both cases to HRS, similar stochastic switching trends to the ones depicted in Figure 3 will most probably be exhibited. It should be noted that the above switching dynamics may only hold for the assumed current percolation circuit model. In practical ReRAM devices, multiple filaments may be formed and ruptured concurrently, which result in a much more complex behavior where antagonistic bipolar and unipolar switching occurs stochastically. It is also worthy pointing out that the stochastic switching characteristics could be correlated to the cell size [7] and ambient temperature [12, 13]. It is anticipated that scaling the devices in submicron dimensions would in principle restrict the defect density and distribution variances, while at the same time, heat accumulation due to ambient temperature could accelerate the switching process. Conclusion In conclusion, we have experimentally demonstrated that practical TiO2-based ReRAM devices with identical initial resistive states could exhibit very dissimilar switching dynamics. Although identical devices could possess phenomenologically similar initial states, we have demonstrated experimentally that their resistive switching occurs at different programming cycles.